A Conjoined Electron and Thermal Transport Study of Thermal Degradation Induced During Normal Operation of Multigate Transistors
- 期刊名称IEEE Transactions on Electron Devices
- 作者Mohamed, Mohamed; Aksamija, Zlatan; Vitale, Wolfgang; Hassan, Fawad; Park, Kyeong-Hyun; Ravaioli, Umberto
- 卷第61卷
- 期第4期
- 印刷ISSN0018-9383
- 电子ISSN1557-9646
- 文件大小2047.32KB
- 发表时间2014-04
- DOI10.1109/ted.2014.2306422
- 页码976-983
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