Built-In Binary Code Inversion Technique for On-Chip Flash Memory Sense Amplifier With Reduced Read Current Consumption
- 期刊名称IEEE Transactions on Very Large Scale Integration (VLSI) Systems
- 作者Daejin Park, ; Tag Gon Kim,
- 卷第22卷
- 期第5期
- 印刷ISSN1063-8210
- 电子ISSN1557-9999
- 文件大小1601.53KB
- 发表时间2014-5
- DOI10.1109/TVLSI.2013.2265894
- 页码1187-1191
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