PVT variations aware low leakage INDEP approach for nanoscale CMOS circuits
Sharma, Vijay Kumar; Pattanaik, Manisha; Raj, Balwinder
- 期刊名称Microelectronics Reliability
- 作者Sharma, Vijay Kumar; Pattanaik, Manisha; Raj, Balwinder
- 卷第54卷
- 期第1期
- 印刷ISSN0026-2714
- 文件大小1845.62KB
- 发表时间2014-1
- DOI10.1016/j.microrel.2013.09.018
- 页码90-99