Simulation of system backend dielectric reliability
- 期刊名称Microelectronics Journal
- 作者Chen, Chang-Chih; Bashir, Muhammad; Milor, Linda; Hyun Kim, Dae; Kyu Lim, Sung
- 卷第45卷
- 期第10期
- 印刷ISSN0026-2692
- 文件大小1564.11KB
- 发表时间2014-10
- DOI10.1016/j.mejo.2014.01.008
- 页码1327-1334
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