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Effects of growth temperature on performance and stability of zinc oxide thin film transistors fabricated by thermal atomic layer deposition

Effects of growth temperature on performance and stability of zinc oxide thin film transistors fabricated by thermal atomic layer deposition

Cho, Sung Woon; Ahn, Cheol Hyoun; Yun, Myeong Gu; Kim, So Hee; Cho, Hyung Koun
  • 期刊名称Thin Solid Films
  • 作者Cho, Sung Woon; Ahn, Cheol Hyoun; Yun, Myeong Gu; Kim, So Hee; Cho, Hyung Koun
  • 卷第562卷
  • 印刷ISSN0040-6090
  • 文件大小1156.50KB
  • 发表时间2014-07
  • DOI10.1016/j.tsf.2014.04.003
  • 页码597-602
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