Local structure determination in strained-layer semiconductors
- 期刊名称Surface Science Reports
- 作者Woicik, Joseph C.
- 卷第69卷
- 期第1期
- 印刷ISSN0167-5729
- 文件大小1642.90KB
- 发表时间2014-03
- DOI10.1016/j.surfrep.2013.12.002
- 页码38-53
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