Unpacking teachers' acceptance of technology: Tests of measurement invariance and latent mean differences
- 期刊名称Computers & Education
- 作者Teo, Timothy
- 卷第75卷
- 印刷ISSN0360-1315
- 文件大小421.92KB
- 发表时间2014-06
- DOI10.1016/j.compedu.2014.01.014
- 页码127-135
IEEE Transactions on Electron Devices publication information2004
IEEE Transactions on Electron Devices publication information2004
IEEE Transactions on Electron Devices publication information2004
IEEE Transactions on Electron Devices publication information2004
IEEE Transactions on Electron Devices publication information2004
IEEE Transactions on Electron Devices publication information2004
IEEE Transactions on Electron Devices publication information2004
IEEE Transactions on Electron Devices publication information2004
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