Scanning Laser-Beam-Induced Current Measurements of Lateral Transport Near-Junction Defects in Silicon Heterojunction Solar Cells
- 期刊名称IEEE Journal of Photovoltaics
- 作者Deceglie, Michael G.; Emmer, Hal S.; Holman, Zachary C.; Descoeudres, Antoine; De Wolf, Stefaan; Ballif, Christophe; Atwater, Harry A.
- 卷第4卷
- 期第1期
- 印刷ISSN2156-3381
- 电子ISSN2156-3403
- 文件大小393.97KB
- 发表时间2014-01
- DOI10.1109/JPHOTOV.2013.2289353
- 页码154-159
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