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A Reliability Enhanced Address Mapping Strategy for Three-Dimensional (3-D) NAND Flash Memory

A Reliability Enhanced Address Mapping Strategy for Three-Dimensional (3-D) NAND Flash Memory

Wang, Yi; Shao, Zili; Chan, Henry C. B.; Bathen, Luis Angel D.; Dutt, Nikil D.

期刊名称IEEE Transactions on Very Large Scale Integration (VLSI) Systems
作者Wang, Yi; Shao, Zili; Chan, Henry C. B.; Bathen, Luis Angel D.; Dutt, Nikil D.
卷第22卷
期第11期
印刷ISSN1063-8210
电子ISSN1557-9999
文件大小1004.93KB
发表时间2014-11
DOI10.1109/tvlsi.2013.2288687
页码2402-2410

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