Depth profiling organic light-emitting devices by gas-cluster ion beam sputtering and X-ray photoelectron spectroscopy
Erickson, Nicholas C.; Raman, Sankar N.; Hammond, John S.; Holmes, Russell J.
- 期刊名称Organic Electronics
- 作者Erickson, Nicholas C.; Raman, Sankar N.; Hammond, John S.; Holmes, Russell J.
- 卷第15卷
- 期第11期
- 印刷ISSN1566-1199
- 文件大小572.32KB
- 发表时间2014-11
- DOI10.1016/j.orgel.2014.08.039
- 页码2988-2992