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Depth profiling organic light-emitting devices by gas-cluster ion beam sputtering and X-ray photoelectron spectroscopy

Depth profiling organic light-emitting devices by gas-cluster ion beam sputtering and X-ray photoelectron spectroscopy

Erickson, Nicholas C.; Raman, Sankar N.; Hammond, John S.; Holmes, Russell J.
  • 期刊名称Organic Electronics
  • 作者Erickson, Nicholas C.; Raman, Sankar N.; Hammond, John S.; Holmes, Russell J.
  • 卷第15卷
  • 期第11期
  • 印刷ISSN1566-1199
  • 文件大小572.32KB
  • 发表时间2014-11
  • DOI10.1016/j.orgel.2014.08.039
  • 页码2988-2992
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