发现好书期刊，享受阅读乐趣

海量图书期刊资源，随时随地畅享阅读乐趣

High speed Bias Temperature Instability measurements on 20nm RMG HKMG MOSFETs

Chandra, Nishant; Chandrashekhar, Sandhya; Francis, Rick; Kerber, Andreas; Srinivasan, Purushothaman; Nigam, Tanya

期刊名称Solid-State Electronics
作者Chandra, Nishant; Chandrashekhar, Sandhya; Francis, Rick; Kerber, Andreas; Srinivasan, Purushothaman; Nigam, Tanya
卷第101卷
印刷ISSN0038-1101
文件大小1107.28KB
发表时间2014-11
DOI10.1016/j.sse.2014.06.032
页码18-22