[IEEE Conference Publications Design Automation and Test in Europe - Dresden, Germany (2014.03.24-2014.03.28)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014 - Design and evaluation of fine-grained power-gating for embedded microprocessors

Kondo, Masaaki; Kobyashi, Hiroaki; Sakamoto, Ryuichi; Wada, Motoki; Tsukamoto, Jun; Namiki, Mitaro; Wang, Weihan; Amano, Hideharu; Matsunaga, Kensaku; Kudo, Masaru; Usami, Kimiyoshi; Komoda, Toshiya; Nakamura, Hiroshi

作者Kondo, Masaaki; Kobyashi, Hiroaki; Sakamoto, Ryuichi; Wada, Motoki; Tsukamoto, Jun; Namiki, Mitaro; Wang, Weihan; Amano, Hideharu; Matsunaga, Kensaku; Kudo, Masaru; Usami, Kimiyoshi; Komoda, Toshiya; Nakamura, Hiroshi
文件大小459.96KB
发表时间2014
DOI10.7873/date.2014.158
页码1-6

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[IEEE Conference Publications Design Automation and Test in Europe - Dresden, Germany (2014.03.24-2014.03.28)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014 - Design and evaluation of fine-grained power-gating for embedded microprocessors