Backend Dielectric Reliability Full Chip Simulator
- 期刊名称IEEE Transactions on Very Large Scale Integration (VLSI) Systems
- 作者Bashir, Muhammad Muqarrab; Chen, Chang-Chih; Milor, Linda; Kim, Dae Hyun; Lim, Sung Kyu
- 卷第22卷
- 期第8期
- 印刷ISSN1063-8210
- 电子ISSN1557-9999
- 文件大小2882.75KB
- 发表时间2014-8
- DOI10.1109/tvlsi.2013.2277856
- 页码1750-1762
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