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A Compact Model of Program Window in HfO<sub><italic>x</italic></sub> RRAM Devices for Conductive Filament Characteristics Analysis

A Compact Model of Program Window in HfO_x RRAM Devices for Conductive Filament Characteristics Analysis

Larcher, Luca; Puglisi, Francesco Maria; Pavan, Paolo; Padovani, Andrea; Vandelli, Luca; Bersuker, Gennadi

期刊名称IEEE Transactions on Electron Devices
作者Larcher, Luca; Puglisi, Francesco Maria; Pavan, Paolo; Padovani, Andrea; Vandelli, Luca; Bersuker, Gennadi
卷第61卷
期第8期
印刷ISSN0018-9383
电子ISSN1557-9646
文件大小1571.40KB
发表时间2014-8
DOI10.1109/ted.2014.2329020
页码2668-2673

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