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[IEEE 2014 IEEE 20th International On-Line Testing Symposium (IOLTS) - Platja d'Aro, Girona, Spain (2014.7.7-2014.7.9)] 2014 IEEE 20th International On-Line Testing Symposium (IOLTS) - A placement strategy for reducing the effects of multiple faults in digital circuits

[IEEE 2014 IEEE 20th International On-Line Testing Symposium (IOLTS) - Platja d'Aro, Girona, Spain (2014.7.7-2014.7.9)] 2014 IEEE 20th International On-Line Testing Symposium (IOLTS) - A placement strategy for reducing the effects of multiple faults in digital circuits

Pagliarini, Samuel N.; Pradhan, Dhiraj

作者Pagliarini, Samuel N.; Pradhan, Dhiraj
文件大小406.25KB
发表时间2014
DOI10.1109/iolts.2014.6873674
页码69-74

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