Raman Spectroscopy-Based Investigation of Thermal Conductivity of Stressed Silicon Microcantilevers
- 期刊名称Journal of Thermophysics and Heat Transfer
- 作者Gan, Ming; Samvedi, Vikas; Tomar, Vikas
- 印刷ISSN0887-8722
- 电子ISSN1533-6808
- 文件大小2512.53KB
- 发表时间2014-10-29
- DOI10.2514/1.T4491
- 页码1-13
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