[IEEE 2014 International Conference on Microelectronic Test Structures (ICMTS) - Udine, Italy (2014.3.24-2014.3.27)] 2014 International Conference on Microelectronic Test Structures (ICMTS) - Statistical analysis of resistive switching characteristics in ReRAM test arrays
- 作者Zambelli, Cristian; Grossi, Alessandro; Olivo, Piero; Walczyk, Damian; Bertaud, Thomas; Tillack, Bernd; Schroeder, Thomas; Stikanov, Valeriy; Walczyk, Christian
- 文件大小1337.26KB
- 发表时间2014
- DOI10.1109/icmts.2014.6841463
- 页码27-31
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