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[IEEE Conference Publications Design Automation and Test in Europe - Dresden, Germany (2014.03.24-2014.03.28)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014 - An embedded offset and gain instrument for OpAmp IPs

[IEEE Conference Publications Design Automation and Test in Europe - Dresden, Germany (2014.03.24-2014.03.28)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014 - An embedded offset and gain instrument for OpAmp IPs

Wan, Jinbo; Kerkhoff, Hans G.

作者Wan, Jinbo; Kerkhoff, Hans G.
文件大小275.41KB
发表时间2014
DOI10.7873/date.2014.031
页码1-4

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