RF-Noise Modeling in Advanced CMOS Technologies
- 期刊名称IEEE Transactions on Electron Devices
- 作者Smit, Geert D. J.; Scholten, Andries J.; Pijper, Ralf M. T.; Tiemeijer, Luuk F.; van der Toorn, Ramses; Klaassen, Dirk B. M.
- 卷第61卷
- 期第2期
- 印刷ISSN0018-9383
- 电子ISSN1557-9646
- 文件大小1590.03KB
- 发表时间2014-02
- DOI10.1109/ted.2013.2282960
- 页码245-254
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