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Observed damage during Argon gas cluster depth profiles of compound semiconductors

Observed damage during Argon gas cluster depth profiles of compound semiconductors

Barlow, Anders J.; Portoles, Jose F.; Cumpson, Peter J.
  • 期刊名称Journal of Applied Physics
  • 作者Barlow, Anders J.; Portoles, Jose F.; Cumpson, Peter J.
  • 卷第116卷
  • 期第5期
  • 印刷ISSN0021-8979
  • 电子ISSN1089-7550
  • 文件大小1095.32KB
  • 发表时间2014-08-07
  • DOI10.1063/1.4892097
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