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Angle of incidence averaging in reflectance measurements with optical microscopes for studying layered two-dimensional materials

Angle of incidence averaging in reflectance measurements with optical microscopes for studying layered two-dimensional materials

Saigal, Nihit; Mukherjee, Amlan; Sugunakar, Vasam; Ghosh, Sandip
  • 期刊名称Review of Scientific Instruments
  • 作者Saigal, Nihit; Mukherjee, Amlan; Sugunakar, Vasam; Ghosh, Sandip
  • 卷第85卷
  • 期第7期
  • 印刷ISSN0034-6748
  • 电子ISSN1089-7623
  • 文件大小797.90KB
  • 发表时间2014-07
  • DOI10.1063/1.4889879
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