Angle of incidence averaging in reflectance measurements with optical microscopes for studying layered two-dimensional materials
Saigal, Nihit; Mukherjee, Amlan; Sugunakar, Vasam; Ghosh, Sandip
- 期刊名称Review of Scientific Instruments
- 作者Saigal, Nihit; Mukherjee, Amlan; Sugunakar, Vasam; Ghosh, Sandip
- 卷第85卷
- 期第7期
- 印刷ISSN0034-6748
- 电子ISSN1089-7623
- 文件大小797.90KB
- 发表时间2014-07
- DOI10.1063/1.4889879