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Frequency feature based quantification of defect depth and thickness

Frequency feature based quantification of defect depth and thickness

Tian, Shulin; Chen, Kai; Bai, Libing; Cheng, Yuhua; Tian, Lulu; Zhang, Hong

期刊名称Review of Scientific Instruments
作者Tian, Shulin; Chen, Kai; Bai, Libing; Cheng, Yuhua; Tian, Lulu; Zhang, Hong
卷第85卷
期第6期
印刷ISSN0034-6748
电子ISSN1089-7623
文件大小955.41KB
发表时间2014-06
DOI10.1063/1.4884518

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