[IEEE 2014 9th IEEE International Conference on Nano/Micro Engineered and Molecular Systems (NEMS) - Waikiki Beach, HI, USA (2014.4.13-2014.4.16)] The 9th IEEE International Conference on Nano/Micro Engineered and Molecular Systems (NEMS) - The phenomenon of “sharp corner” of Electrolyte-Oxide-Semiconductor structure for copper ions detection
- 作者Gao, J. G.; Wang, H.; Ma, P. C.; Wu, Wengang
- 文件大小622.11KB
- 发表时间2014
- DOI10.1109/nems.2014.6908821
- 页码337-340