[IEEE 2014 IEEE 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Marina Bay Sands, Singapore (2014.6.30-2014.7.4)] Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Thermal ions diffusion on printed circuit board
Yeoh, Lai-Seng; Chong, Kok-Cheng; Li, Susan
- 作者Yeoh, Lai-Seng; Chong, Kok-Cheng; Li, Susan
- 文件大小1957.90KB
- 发表时间2014
- DOI10.1109/ipfa.2014.6898138
- 页码54-57