[IEEE 2014 IEEE 20th International On-Line Testing Symposium (IOLTS) - Platja d'Aro, Girona, Spain (2014.7.7-2014.7.9)] 2014 IEEE 20th International On-Line Testing Symposium (IOLTS) - Framework for economical error recovery in embedded cores
Upasani, Gaurang; Vera, Xavier; Gonzalez, Antonio
- 作者Upasani, Gaurang; Vera, Xavier; Gonzalez, Antonio
- 文件大小1041.52KB
- 发表时间2014
- DOI10.1109/iolts.2014.6873687
- 页码146-153