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[IEEE 2014 IEEE 20th International On-Line Testing Symposium (IOLTS) - Platja d'Aro, Girona, Spain (2014.7.7-2014.7.9)] 2014 IEEE 20th International On-Line Testing Symposium (IOLTS) - Framework for economical error recovery in embedded cores

[IEEE 2014 IEEE 20th International On-Line Testing Symposium (IOLTS) - Platja d'Aro, Girona, Spain (2014.7.7-2014.7.9)] 2014 IEEE 20th International On-Line Testing Symposium (IOLTS) - Framework for economical error recovery in embedded cores

Upasani, Gaurang; Vera, Xavier; Gonzalez, Antonio
  • 作者Upasani, Gaurang; Vera, Xavier; Gonzalez, Antonio
  • 文件大小1041.52KB
  • 发表时间2014
  • DOI10.1109/iolts.2014.6873687
  • 页码146-153
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