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[IEEE 2014 IEEE International Conference on Industrial Technology (ICIT) - Busan, South Korea (2014.2.26-2014.3.1)] 2014 IEEE International Conference on Industrial Technology (ICIT) - Infrared small target discrimination using sequential forward feature selection with AUC mettric

[IEEE 2014 IEEE International Conference on Industrial Technology (ICIT) - Busan, South Korea (2014.2.26-2014.3.1)] 2014 IEEE International Conference on Industrial Technology (ICIT) - Infrared small target discrimination using sequential forward feature selection with AUC mettric

Kim, Sungho; Kim, Kyung-Tae; Kim, Sohyun
  • 作者Kim, Sungho; Kim, Kyung-Tae; Kim, Sohyun
  • 文件大小239.05KB
  • 发表时间2014
  • DOI10.1109/icit.2014.6895005
  • 页码641-644
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