[IEEE 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Amsterdam, Netherlands (2014.10.1-2014.10.3)] 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Estimating the effect of single-event upsets on microprocessors
- 作者Constantinescu, Cristian; Krishnamoorthy, Srini; Nguyen, Tuyen
- 文件大小366.60KB
- 发表时间2014
- DOI10.1109/DFT.2014.6962059
- 页码185-190
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