[IEEE 2014 22nd Iranian Conference on Electrical Engineering (ICEE) - Tehran, Iran (2014.5.20-2014.5.22)] 2014 22nd Iranian Conference on Electrical Engineering (ICEE) - A new low-leakage T-Gate based 8T SRAM cell with improved write-ability in 90nm CMOS technology
Pasandi, Ghasem; Qasemi, Ehsan; Fakhraie, Sied Mehdi
- 作者Pasandi, Ghasem; Qasemi, Ehsan; Fakhraie, Sied Mehdi
- 文件大小2314.12KB
- 发表时间2014
- DOI10.1109/iraniancee.2014.6999569
- 页码382-386