[IEEE 2014 20th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC) - Greenwich, London, United Kingdom (2014.9.24-2014.9.26)] 20th International Workshop on Thermal Investigations of ICs and Systems - Thermal properties of interconnects in power MOSFETs
Burenkov, Alex; Baer, Eberhard; Boianceanu, Cristian
- 作者Burenkov, Alex; Baer, Eberhard; Boianceanu, Cristian
- 文件大小3482.21KB
- 发表时间2014
- DOI10.1109/therminic.2014.6972518
- 页码1-6