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Improving Scanning Electron Microscope Resolution for Near Planar Samples Through the Use of Image Restoration

Improving Scanning Electron Microscope Resolution for Near Planar Samples Through the Use of Image Restoration

Lifshin, Eric; Kandel, Yudhishthir P.; Moore, Richard L.

期刊名称Microscopy and Microanalysis
作者Lifshin, Eric; Kandel, Yudhishthir P.; Moore, Richard L.
卷第20卷
期第1期
印刷ISSN1431-9276
电子ISSN1435-8115
文件大小726.78KB
发表时间2014-02
DOI10.1017/S1431927613013688
页码78-89

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