Diagnostic Test Generation for Transition Delay Faults Using Stuck-At Fault Detection Tools
- 期刊名称Journal of Electronic Testing
- 作者Zhang, Yu; Zhang, Bei; Agrawal, Vishwani D.
- 卷第30卷
- 期第6期
- 印刷ISSN0923-8174
- 电子ISSN1573-0727
- 文件大小2114.35KB
- 发表时间2014-12
- DOI10.1007/s10836-014-5490-4
- 页码763-780
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