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Electron and Force Microscopy Characterization of Particle Size Effects and Surface Phenomena Associated with Individual Natural Organic Matter Fractions

Electron and Force Microscopy Characterization of Particle Size Effects and Surface Phenomena Associated with Individual Natural Organic Matter Fractions

Hoffman, Lee W.; Chilom, Gabriela; Venkatesan, Swaminathan; Rice, James A.
  • 期刊名称Microscopy and Microanalysis
  • 作者Hoffman, Lee W.; Chilom, Gabriela; Venkatesan, Swaminathan; Rice, James A.
  • 卷第20卷
  • 期第2期
  • 印刷ISSN1431-9276
  • 电子ISSN1435-8115
  • 文件大小1407.63KB
  • 发表时间2014-04
  • DOI10.1017/s1431927614000038
  • 页码521-530
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