Probabilistic sensitivity analysis for novel second-order reliability method (SORM) using generalized chi-squared distribution
Yoo, David; Lee, Ikjin; Cho, Hyunkyoo
- 期刊名称Structural and Multidisciplinary Optimization
- 作者Yoo, David; Lee, Ikjin; Cho, Hyunkyoo
- 卷第50卷
- 期第5期
- 印刷ISSN1615-147X
- 电子ISSN1615-1488
- 文件大小490.16KB
- 发表时间2014-11
- DOI10.1007/s00158-014-1081-3
- 页码787-797