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The Influence of Water Absorbed in Grain Boundary of a Polycrystalline NiO Layer on the Memory Characteristics of Pt/NiO/Pt Resistive Random Access Memory (ReRAM)

Ogata, Ryosuke; Yoshihara, Masataka; Murayama, Naohiro; Kishida, Satoru; Kinoshita, Kentaro

期刊名称MRS Proceedings
作者Ogata, Ryosuke; Yoshihara, Masataka; Murayama, Naohiro; Kishida, Satoru; Kinoshita, Kentaro
卷第1691卷
电子ISSN1946-4274
文件大小667.72KB
发表时间2014
DOI10.1557/opl.2014.792