[IEEE 2014 29th Symposium on Microelectronics Technology and Devices (SBMicro) - Aracaju, Brazil (2014.9.1-2014.9.5)] 2014 29th Symposium on Microelectronics Technology and Devices (SBMicro) - The effect of X-Ray radiation dose rate on Triple-Gate SOI FinFETs parameters

Bordallo, Caio C. M.; Teixeira, Fernando F.; Silveira, Marcilei A. G.; Martino, Joao A.; Agopian, Paula G. D.; Simoen, Eddy; Claeys, Cor

作者Bordallo, Caio C. M.; Teixeira, Fernando F.; Silveira, Marcilei A. G.; Martino, Joao A.; Agopian, Paula G. D.; Simoen, Eddy; Claeys, Cor
文件大小1040.17KB
发表时间2014
DOI10.1109/sbmicro.2014.6940085
页码1-4

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