Application of TXRF for burn leach test of TRISO coated UO2particles

Sanyal, Kaushik; Dhara, Sangita; Sanjay Kumar, S.; Misra, N. L.; Mollick, P. K.; Rao, P. T.; Venugopalan, R.; Pai, Rajesh V.; Kumar, N.; Mukerjee, S. K.; Chakravartty, J. K.; Aggarwal, S. K.

期刊名称Journal of Radioanalytical and Nuclear Chemistry
作者Sanyal, Kaushik; Dhara, Sangita; Sanjay Kumar, S.; Misra, N. L.; Mollick, P. K.; Rao, P. T.; Venugopalan, R.; Pai, Rajesh V.; Kumar, N.; Mukerjee, S. K.; Chakravartty, J. K.; Aggarwal, S. K.
卷第302卷
期第3期
印刷ISSN0236-5731
电子ISSN1588-2780
文件大小640.54KB
发表时间2014-12
DOI10.1007/s10967-014-3593-0
页码1357-1361

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Application of TXRF for burn leach test of TRISO coated UO2particles