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[IEEE 2014 IEEE International Power Electronics and Application Conference and Exposition (PEAC) - Shanghai, China (2014.11.5-2014.11.8)] 2014 International Power Electronics and Application Conference and Exposition - Thermal reliability analysis of non-gate dielectric film in IEC-GCT

[IEEE 2014 IEEE International Power Electronics and Application Conference and Exposition (PEAC) - Shanghai, China (2014.11.5-2014.11.8)] 2014 International Power Electronics and Application Conference and Exposition - Thermal reliability analysis of non-gate dielectric film in IEC-GCT

Zhang, Ruliang; Gao, Yong; Wang, Cailin; Yang, Pengfei

作者Zhang, Ruliang; Gao, Yong; Wang, Cailin; Yang, Pengfei
文件大小1292.18KB
发表时间2014
DOI10.1109/PEAC.2014.7038065
页码1378-1381

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