[IEEE 2014 IEEE International Symposium on Electromagnetic Compatibility - EMC 2014 - Raleigh, NC, USA (2014.8.4-2014.8.8)] 2014 IEEE International Symposium on Electromagnetic Compatibility (EMC) - Integrated-circuit countermeasures against information leakage through EM radiation
Miura, Noriyuki; Fujimoto, Daisuke; Hayashi, Yu-ichi; Homma, Naofumi; Aoki, Takafumi; Nagata, Makoto
- 作者Miura, Noriyuki; Fujimoto, Daisuke; Hayashi, Yu-ichi; Homma, Naofumi; Aoki, Takafumi; Nagata, Makoto
- 文件大小1010.16KB
- 发表时间2014
- DOI10.1109/ISEMC.2014.6899068
- 页码748-751