Progress in SiC MOSFET Reliability
- 期刊名称ECS Transactions
- 作者Flicker, J. D.; Hughart, D. R.; Atcitty, S.; Kaplar, R. J.; Marinella, M.
- 卷第64卷
- 期第7期
- 印刷ISSN1938-6737
- 电子ISSN1938-5862
- 文件大小1016.13KB
- 发表时间2014-08-08
- DOI10.1149/06407.0087ecst
- 页码87-98
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