A Reliability-Aware Address Mapping Strategy for NAND Flash Memory Storage Systems
- 期刊名称IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
- 作者Wang, Yi; Huang, Min; Shao, Zili; Chan, Henry C. B.; Bathen, Luis Angel D.; Dutt, Nikil D.
- 卷第33卷
- 期第11期
- 印刷ISSN0278-0070
- 电子ISSN1937-4151
- 文件大小928.55KB
- 发表时间2014-11
- DOI10.1109/tcad.2014.2347929
- 页码1623-1631
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