Cell-Aware Test
- 期刊名称IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
- 作者Hapke, Friedrich; Redemund, Wilfried; Glowatz, Andreas; Rajski, Janusz; Reese, Michael; Hustava, Marek; Keim, Martin; Schloeffel, Juergen; Fast, Anja
- 卷第33卷
- 期第9期
- 印刷ISSN0278-0070
- 电子ISSN1937-4151
- 文件大小3266.17KB
- 发表时间2014-9
- DOI10.1109/TCAD.2014.2323216
- 页码1396-1409
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