SPIE Proceedings [SPIE SPIE Remote Sensing - Amsterdam, Netherlands (Monday 22 September 2014)] Sensors, Systems, and Next-Generation Satellites XVIII - Effects of Lambertian sources design on uniformity and measurements
Meynart, Roland; Neeck, Steven P.; Shimoda, Haruhisa; Cariou, Nadine; Durell, Chris; McKee, Greg; Wilks, Dylan; Glastre, Wilfried
- 作者Meynart, Roland; Neeck, Steven P.; Shimoda, Haruhisa; Cariou, Nadine; Durell, Chris; McKee, Greg; Wilks, Dylan; Glastre, Wilfried
- 卷第9241卷
- 印刷ISSN0277-786X
- 文件大小435.46KB
- 发表时间2014
- DOI10.1117/12.2066739