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SPIE Proceedings [SPIE SPIE Remote Sensing - Amsterdam, Netherlands (Monday 22 September 2014)] Sensors, Systems, and Next-Generation Satellites XVIII - Effects of Lambertian sources design on uniformity and measurements

SPIE Proceedings [SPIE SPIE Remote Sensing - Amsterdam, Netherlands (Monday 22 September 2014)] Sensors, Systems, and Next-Generation Satellites XVIII - Effects of Lambertian sources design on uniformity and measurements

Meynart, Roland; Neeck, Steven P.; Shimoda, Haruhisa; Cariou, Nadine; Durell, Chris; McKee, Greg; Wilks, Dylan; Glastre, Wilfried
  • 作者Meynart, Roland; Neeck, Steven P.; Shimoda, Haruhisa; Cariou, Nadine; Durell, Chris; McKee, Greg; Wilks, Dylan; Glastre, Wilfried
  • 卷第9241卷
  • 印刷ISSN0277-786X
  • 文件大小435.46KB
  • 发表时间2014
  • DOI10.1117/12.2066739
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