[IEEE 2014 Electronics System-Integration Technology Conference (ESTC) - Helsinki, Finland (2014.9.16-2014.9.18)] Proceedings of the 5th Electronics System-integration Technology Conference (ESTC) - Development of void free, high reliability underfill encapsulated fine pitch system on flex packages
Pun, Kelvin; Sharma, Anupam; Singh, Amandeep; Islam, M. N.; Ng, Tin Wing
- 作者Pun, Kelvin; Sharma, Anupam; Singh, Amandeep; Islam, M. N.; Ng, Tin Wing
- 文件大小1010.22KB
- 发表时间2014
- DOI10.1109/ESTC.2014.6962785
- 页码1-5