[IEEE 2014 International Conference on Electrical Sciences and Technologies in Maghreb (CISTEM) - Tunis, Tunisia (2014.11.3-2014.11.6)] 2014 International Conference on Electrical Sciences and Technologies in Maghreb (CISTEM) - Experimental study on the EMI and switching time evolution of IGBT devices after operating aging tests
- 作者Tlig, Mohamed; Ben Hadj Slama, Jaleleddine; Belaid, M.A
- 文件大小491.31KB
- 发表时间2014
- DOI10.1109/CISTEM.2014.7076991
- 页码1-5
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