[IEEE 2014 12th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Novosibirsk, Russia (2014.10.2-2014.10.4)] 2014 12th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Stability analysis systems of the metrological providing and managements
- 作者Palchun, Yu. A.; Yelistratova, I. B.
- 文件大小759.87KB
- 发表时间2014
- DOI10.1109/apeie.2014.7040871
- 页码187-189