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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 17 August 2014)] X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II - Polarization measurement of free electron laser pulses in the VUV generated by the variable polarization source FERMI

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 17 August 2014)] X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II - Polarization measurement of free electron laser pulses in the VUV generated by the variable polarization source FERMI

Hau-Riege, Stefan P.; Moeller, Stefan P.; Yabashi, Makina; Finetti, P.; Allaria, E.; Diviacco, B.; Callegari, C.; Mahieu, B.; Viefhaus, J.; Zangrando, M.; De Ninno, G.; Lambert, G.; Ferrari, E.; Buck, J.; Ilchen, M.; Vodungbo, B.; Mahne, N.; Svetina, C.; Spezzani, C.; Di Mitri, S.; Penco, G.; Trovò, M.; Fawley, W. M.; Rebernik, P.; Gauthier, D.; Grazioli, C.; Coreno, M.; Ressel, B.; Kivimäki, A.; Mazza, T.; Glaser, L.; Scholz, F.; Seltmann, J.; Gessler, P.; Grünert, J.; De Fanis, A.; Meyer, M.; Knie, A.; Moeller, S. P.; Raimondi, L.; Capotondi, F.; Pedersoli, E.; Plekan, O.; Danailov, M.; Demidovich, A.; Nikolov, I.; Abrami, A.; Gautier, J.; Lüning, J.; Zeitoun, P.; Giannessi, L.
  • 作者Hau-Riege, Stefan P.; Moeller, Stefan P.; Yabashi, Makina; Finetti, P.; Allaria, E.; Diviacco, B.; Callegari, C.; Mahieu, B.; Viefhaus, J.; Zangrando, M.; De Ninno, G.; Lambert, G.; Ferrari, E.; Buck, J.; Ilchen, M.; Vodungbo, B.; Mahne, N.; Svetina, C.; Spezzani, C.; Di Mitri, S.; Penco, G.; Trovò, M.; Fawley, W. M.; Rebernik, P.; Gauthier, D.; Grazioli, C.; Coreno, M.; Ressel, B.; Kivimäki, A.; Mazza, T.; Glaser, L.; Scholz, F.; Seltmann, J.; Gessler, P.; Grünert, J.; De Fanis, A.; Meyer, M.; Knie, A.; Moeller, S. P.; Raimondi, L.; Capotondi, F.; Pedersoli, E.; Plekan, O.; Danailov, M.; Demidovich, A.; Nikolov, I.; Abrami, A.; Gautier, J.; Lüning, J.; Zeitoun, P.; Giannessi, L.
  • 卷第9210卷
  • 印刷ISSN0277-786X
  • 文件大小2056.11KB
  • 发表时间2014
  • DOI10.1117/12.2062717
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