SPIE Proceedings [SPIE SPIE Photonics Europe - Brussels, Belgium (Monday 14 April 2014)] Optical Modelling and Design III - Use of Costas arrays in subpixel metrology

Wyrowski, Frank; Sheridan, John T.; Tervo, Jani; Meuret, Youri; Healy, John J.; Sweeney, Gavin; Mas, David; Sheridan, John T.

作者Wyrowski, Frank; Sheridan, John T.; Tervo, Jani; Meuret, Youri; Healy, John J.; Sweeney, Gavin; Mas, David; Sheridan, John T.
卷第9131卷
印刷ISSN0277-786X
文件大小361.02KB
发表时间2014
DOI10.1117/12.2051787

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