In-operando hard X-ray photoelectron spectroscopy study on the impact of current compliance and switching cycles on oxygen and carbon defects in resistive switching Ti/HfO
2
/TiN cells
Sowinska, Malgorzata; Bertaud, Thomas; Walczyk, Damian; Thiess, Sebastian; Calka, Pauline; Alff, Lambert; Walczyk, Christian; Schroeder, Thomas
- 期刊名称Journal of Applied Physics
- 作者Sowinska, Malgorzata; Bertaud, Thomas; Walczyk, Damian; Thiess, Sebastian; Calka, Pauline; Alff, Lambert; Walczyk, Christian; Schroeder, Thomas
- 卷第115卷
- 期第20期
- 印刷ISSN0021-8979
- 电子ISSN1089-7550
- 文件大小1770.35KB
- 发表时间2014-05-28
- DOI10.1063/1.4879678