Characterization of nanometer-thick polycrystalline silicon with phonon-boundary scattering enhanced thermoelectric properties and its application in infrared sensors
- 期刊名称Nanoscale
- 作者Zhou, Huchuan; Kropelnicki, Piotr; Lee, Chengkuo
- 卷第7卷
- 期第2期
- 印刷ISSN2040-3364
- 电子ISSN2040-3372
- 文件大小2192.19KB
- 发表时间2015
- DOI10.1039/c4nr04184d
- 页码532-541