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Effect of stacking fault in silicon induced by nanoindentation with MD simulation

Effect of stacking fault in silicon induced by nanoindentation with MD simulation

Guo, Xiaoguang; Zhai, Changheng; Liu, Ziyuan; Zhang, Liang; Jin, Zhuji; Guo, Dongming
  • 期刊名称Materials Science in Semiconductor Processing
  • 作者Guo, Xiaoguang; Zhai, Changheng; Liu, Ziyuan; Zhang, Liang; Jin, Zhuji; Guo, Dongming
  • 卷第30卷
  • 印刷ISSN1369-8001
  • 文件大小6719.92KB
  • 发表时间2015-02
  • DOI10.1016/j.mssp.2014.09.029
  • 页码112-117
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